New structure for a six-port reflectometer in monolithic microwave integrated-circuit technology

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New Structure for a Six-Port Reflectometer in Monolithic Microwave Integrated-Circuit Technology

This paper presents a new structure for a six-port reflectometer which due to its simplicity can be implemented very easily in monolithic microwave integrated-circuit (MMIC) technology. It uses nonmatched diode detectors with a high input impedance which are placed around a phase shifter in conjunction with a power divider for the reference detector. The circuit has been fabricated using the F2...

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A new robust method for six-port reflectometer calibration

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ژورنال

عنوان ژورنال: IEEE Transactions on Instrumentation and Measurement

سال: 1997

ISSN: 0018-9456

DOI: 10.1109/19.571902