New structure for a six-port reflectometer in monolithic microwave integrated-circuit technology
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چکیده
منابع مشابه
New Structure for a Six-Port Reflectometer in Monolithic Microwave Integrated-Circuit Technology
This paper presents a new structure for a six-port reflectometer which due to its simplicity can be implemented very easily in monolithic microwave integrated-circuit (MMIC) technology. It uses nonmatched diode detectors with a high input impedance which are placed around a phase shifter in conjunction with a power divider for the reference detector. The circuit has been fabricated using the F2...
متن کاملWIEDMANN et al.: NEW STRUCTURE FOR A SIX-PORT REFLECTOMETER IN MMIC TECHNOLOGY 1 New Structure for a Six-Port Re ectometer in MMIC Technology
| This paper presents a new structure for a six-port reeectometer which due to its simplicity can be implemented very easily in MMIC technology. It uses non-matched diode detectors with a high input impedance which are placed around a phase shifter in conjunction with a power divider for the reference detector. The circuit has been fabricated using the F20 GaAs process of the GEC-Marconi foundr...
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A new robust method for six-port reflectometer calibration
A new robust method for finding the parameters of Engen’s six-port-to-four-port reduction algorithm for sixport reflectometer calibration has been developed. Like other previously published methods, it uses a minimum of five loads with an unknown but constant absolute value of the reflection coefficient and unknown but well-distributed phases. However, the quality of the parameter estimates is ...
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The design of a wideband microwave reflectometer for the purpose of inclusion in a breast cancer detection system is presented. In this system, a wideband frequency source is used to synthesize a narrow pulse via the stepfrequency synthesis method. The reflectometer undertakes measurements in frequency domain and the collected data is transformed into time/space domain using IFFT. In order to a...
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ژورنال
عنوان ژورنال: IEEE Transactions on Instrumentation and Measurement
سال: 1997
ISSN: 0018-9456
DOI: 10.1109/19.571902